发明名称 AN A.C. FIELD MEASUREMENT SYSTEM FOR DETECTING AND SIZING DEFECTS IN A CONDUCTOR
摘要 An a.c. field measurement testing system comprises a probe including a yoke (10) for inducing a uniform a.c. field, sensor means (7, 8. 9) comprising a first coil (8) having a longitudinal axis extending in a first direction and a second coil (9) having a longitudinal iris extending in a second direction orthogonal to the first direction and means (11) for effecting energisation of the field, the arrangement being such that signals produced by the coils (8, 9) indicative of defects in a test piece are processed whereby one component of a magnetic field is plotted against another in a display.
申请公布号 CA2099785(C) 申请公布日期 1999.08.24
申请号 CA19922099785 申请日期 1992.01.10
申请人 发明人 TOPP, DAVID ANTHONY;LUGG, MARTIN CHRISTOPHER
分类号 G01N27/82;(IPC1-7):G01N27/82 主分类号 G01N27/82
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