发明名称 Phase-contrast x-ray imaging system
摘要 A phase-contrast X-ray imaging system according to the present invention comprises an X-ray interferometer, wherein X-ray interfering beams thicker than 2 cmx2 cm are formed enabling observation of comparatively large objects. The X-ray interferometer is constituted by two crystal blocks which each are monolithically cut out from ingots of crystal and have two wafers which function as X-ray half mirrors. An optical equipment, a chamber, and a feedback system are incorporated to adjust and stabilize the crystal blocks. A device is also incorporated to obtain an image showing the distribution of the X-ray phase shift with which diagnosis become easier and reliable.
申请公布号 US5930325(A) 申请公布日期 1999.07.27
申请号 US19980204154 申请日期 1998.12.03
申请人 HITACHI, LTD. 发明人 MOMOSE, ATSUSHI
分类号 A61B6/00;G01N23/04;G01N23/201;(IPC1-7):G03H5/00 主分类号 A61B6/00
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