| 摘要 |
<p>An improved test system comprises a printed circuit board (13) and a tested assembly wherein the printed circuit board (13) has a plastic chassis encompassing one surface and a set of power pads (33, 35) may be coupled to conductors on the one surface of the printed circuit board (13) and a second surface of the set of power pads (33, 35) is available for electrical coupling through an opening in the plastic chassis. The test assembly vertically pushes down on the printed circuit board until the second surface of the set of power pads contacts a power source, thus electrically coupling the printed circuit board to the power source (15).</p> |
