发明名称 Semiconductor memory with built-in parallel bit test mode
摘要 <p>A semiconductor memory comprising a memory cell block 111 comprising a plurality of memory cells, having n pairs of parallel bit structure; two pairs of word lines WL connected to said memory cells of said memory cell block; n pairs of bit lines BL, /BL connected to said memory cells of said memory cell block; n pairs of DQ data lines DQ05, /DQ05 - DQ35, /DQ35 connected to said n pairs of bit lines and divided into two groups each comprising n/2 pairs of the DQ data lines, a group of n/2 pairs of the DQ lines being arranged at a side of said memory cell block and another group of n/2 pairs of the DQ lines being arranged at an opposite side of said memory cell block. &lt;IMAGE&gt;</p>
申请公布号 EP0929077(A2) 申请公布日期 1999.07.14
申请号 EP19990104096 申请日期 1994.01.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OHSAWA, TAKASHI;FUJII, SHUSO
分类号 G11C11/401;G11C29/08;G11C29/24;G11C29/28;G11C29/34;G11C29/40;G11C29/44;(IPC1-7):G11C29/00 主分类号 G11C11/401
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