发明名称 METHOD OF MEASURING SURFACE TEMPERATURE OF MOLTEN LIQUID IN SINGLE CRYSTAL PULL-UP FURNACE AND DEVICE FOR THE METHOD
摘要 PROBLEM TO BE SOLVED: To accurately measure the temperature of surface of a part which receives less influence of stray light component in a simple operation by locating a part of a minimum radiation luminousity through the measurement of radia tion luminousity distribution from the surface of molten liquid in a single crystal pull-up furnace, and measuring the temperature of the part by the use of a radiation temperature measurement means. SOLUTION: A CCD camera 21 is placed outside of an opening 19 of a single crystal pull-up furnace 10, and a wall 15 of an upper chamber reflected on the surface of molten liquid 17a is viewed in a visual field D. After a radiation luminuousity signal for every part in the visual field D is fed to a computation means, a minimum luminousity signal is selected from radiation luminousity signals, and a part A radiating the signal is detected. Outside of the opening 19 a monocolor radiation thermometer is placed, and the radiation part A is viewed in the relatively narrow visual filed D. A computation means computes and measures the temperature of the surface of molten liquid to transmit the signal to a power supply control portion.
申请公布号 JPH11190662(A) 申请公布日期 1999.07.13
申请号 JP19970358899 申请日期 1997.12.26
申请人 SUMITOMO SITIX CORP 发明人 TAKANASHI KEIICHI;MAEDA TOKUJI
分类号 G01J5/02;C30B15/22;C30B15/26;G01J5/00;(IPC1-7):G01J5/02 主分类号 G01J5/02
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