发明名称 |
Method of producing a semiconductor wafer and a cleaning apparatus for the same |
摘要 |
A method of producing a semiconductor wafer in which a semiconductor wafer cut by a wire saw can be cleaned efficiently and in automatic steps and abrasive grains are substantially completely removed away, and a cleaning apparatus for the method are provided. A semiconductor ingot is cut by a wire saw into cut semiconductor wafers. Each of the cut semiconductor wafers is degrease-cleaned, the semiconductor wafer which has been degrease-cleaned is oil-water separation-cleaned, the semiconductor wafer which has been oil-water separation-cleaned is rinsed, abrasive grains are removed away from the surface of the semiconductor wafer which has been rinse-cleaned, by alkali cleaning, the semiconductor wafer which has been abrasive grain removal-cleaned is separated from a slicing plate.
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申请公布号 |
US5922137(A) |
申请公布日期 |
1999.07.13 |
申请号 |
US19970884851 |
申请日期 |
1997.06.30 |
申请人 |
KOMATSU ELECTRONIC METALS CO., LTD. |
发明人 |
FUKUNAGA, HISAYA;KUROGI, KATSUTOSHI |
分类号 |
B28D5/04;B28D5/00;H01L21/00;H01L21/304;(IPC1-7):C03C23/00;B08B7/00;B08B9/00 |
主分类号 |
B28D5/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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