SEMICONDUCTOR STORAGE AND DATA PROCESSOR

摘要

PROBLEM TO BE SOLVED: To quicken read even in the case of relief. SOLUTION: A redundant block (SPA) for relieving a memory block containing a defect, a relief information holding means (REG) for holding relieve information, and selection means (WSEL and RSEL) for selecting the redundant block instead of the memory block with the defect based on the held information of the relief information holding means for circuit operation are provided. They select the redundant block instead of the memory cell array with the defect for circuit operation, thus eliminating the need to compare an input address with a redundant one for each input of an address signal and hence quickening memory access.