| 发明名称 |
EASILY TESTED INTEGRATED CIRCUIT, DESIGNING METHOD FOR EASILY TESTING INTEGRATED CIRCUIT, AND STORAGE MEDIUM FOR READING PROGRAM FOR DESIGNING FOR EASILY TESTING INTEGRATED CIRCUIT BY COMPUTER |
| 摘要 |
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| 申请公布号 |
JPH11166962(A) |
申请公布日期 |
1999.06.22 |
| 申请号 |
JP19970332832 |
申请日期 |
1997.12.03 |
| 申请人 |
HANDOTAI RIKOUGAKU KENKYU CENTER:KK |
发明人 |
FUJIWARA HIDEO;MASUZAWA TOSHIMITSU;OTAKE TETSUSHI |
| 分类号 |
G01R31/28;G01R31/3183;G01R31/3185;G06F17/50;(IPC1-7):G01R31/318 |
主分类号 |
G01R31/28 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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