发明名称 Method of manufacturing heterojunction bipolar device having Si1-x Gex base
摘要 In a semiconductor device manufacturing method for forming first and second bipolar transistors on a semiconductor substrate 1, a link base layer 5 for connecting a graft base layer (graft base layer 8) of the first bipolar transistor and an intrinsic base layer 12 to each other, and at least a part of a base layer 6 of the second bipolar transistor are formed simultaneously with each other, and then the link base layer 5 in a region where the intrinsic base layer 12 will be formed is removed by an etching treatment, and then by a selective epitaxial growth method, the intrinsic base layer 12 is formed in the region where the link base layer 5 is removed.
申请公布号 US5915186(A) 申请公布日期 1999.06.22
申请号 US19970993862 申请日期 1997.12.18
申请人 SONY CORPORATION 发明人 GOMI, TAKAYUKI
分类号 H01L29/73;H01L21/331;H01L21/82;H01L21/8222;H01L27/06;H01L29/732;(IPC1-7):H01L21/331 主分类号 H01L29/73
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