TEST CIRCUIT AND TEST METHOD FOR A/D CONVERTER AND D/A CONVERTER BUILT INTO INTEGRATED CIRCUIT,申请号JP19970326080-传众专利搜索

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发明名称	TEST CIRCUIT AND TEST METHOD FOR A/D CONVERTER AND D/A CONVERTER BUILT INTO INTEGRATED CIRCUIT
摘要
申请公布号	JPH11163724(A)	申请公布日期	1999.06.18
申请号	JP19970326080	申请日期	1997.11.27
申请人	NEC CORP	发明人	HIRASAWA MASAHIRO
分类号	G08C13/00;G01R31/28;G01R31/316;G01R31/3185;H03M1/10;(IPC1-7):H03M1/10;G01R31/318	主分类号	G08C13/00
代理机构		代理人
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