发明名称 APPARATUS FOR INSPECTING MOUNT STATE OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide an apparatus that can accurately inspect a mount state of electronic components. SOLUTION: A mount state-inspecting apparatus picks up a color image of a mounted substrate 5 by a color camera 11, thereby inspecting a mount state. In the apparatus, a white light introduced from a white light source part 19 is projected from end parts 17a of fiber cables 17 arranged uniformly in a plurality of circles to a reflecting part 16 having an opening part 16a at an upper part and a hemispherical diffusion reflection face, so that the mounted substrate 5 is illuminated with the diffused and reflected white light. Generation of shades and gloss of electronic components because of the illumination is thus eliminated. A colored light from a colored light source part 20 is projected by a half mirror 21 to the mounted substrate 5 from the same axial direction as the color camera 11, so that a polarity mark having a smooth reflection face of different surface roughness from other parts can be detected.
申请公布号 JPH11160248(A) 申请公布日期 1999.06.18
申请号 JP19970329947 申请日期 1997.12.01
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YANO KEIJI
分类号 G01N21/88;G01B11/00;G01N21/956;H05K13/08 主分类号 G01N21/88
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