发明名称 INTERCONNECTOR OF SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 Wiring for a semiconductor device which is suitable for high density device packing, and a method for forming the same, are disclosed. The wiring includes: impurity regions formed in a substrate on both sides of an insulated gate electrode; a first conduction layer formed on the impurity regions; and a second conduction layer formed in contact with the first conduction layer on one side of the gate electrode. The method includes the steps of: forming impurity regions in a substrate on both sides of an insulated gate electrode; forming a first conduction layer on the impurity regions; and forming a second conduction layer in contact on one side of the gate electrode with the first conduction layer.
申请公布号 KR100198634(B1) 申请公布日期 1999.06.15
申请号 KR19960038789 申请日期 1996.09.07
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 LEE, CHANG-SEI
分类号 H01L21/28;H01L21/768;H01L21/8242;H01L23/485;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址