首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD AND DEVICE FOR MEASURING LOW AND HIGH TEMPERATURE ELECTRIC CHARACTERISTICS
摘要
申请公布号
JPH11142469(A)
申请公布日期
1999.05.28
申请号
JP19970302570
申请日期
1997.11.05
申请人
NEC CORP
发明人
DOUKAWA YOSHIHIRO
分类号
G01R31/26;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
您可能感兴趣的专利
GUIDING ELEMENT FOR A STEERING SHAFT FIXING DEVICE
VALVE BOOSTER
METHOD FOR PRODUCING A METAL STRIP, IN PARTICULAR FROM A HOT-ROLLED STEEL STRIP CONSISTING OF A CONTINUOUS CAST PRE-STRIP
Sprinkler device comprising a bi-directionally pivotable sprinkler head
Truss hook
System for inputting speech, radio receiver and communication system
Bias control for hbt power amplifiers
Tone scale adjustment of digital images
Improvements in or relating to digging apparatus and methods
INK CARTRIDGE AND RECORDING APPARATUS
Service and event synchronous/asynchronous manager
TRANSPORT FRAME FOR METAL ANODES
Pneumatic spool valve
APPARATUS AND METHOD FOR DETECTION OF MATERIAL DISCONTINUITIES BY USING ELECTROMAGNETIC ACOUSTIC TRANSDUCERS
Device
Multilayer ceramic substrate with internal connection part wider than external terminal
SYSTEM AND METHOD FOR FACE AND BODY TREATMENT
Compressed gas operated pistol having movable barrel/seal arrangement
Coloured glass
A security mechanism providing access control for locally-held data
