发明名称 PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a processing apparatus which can perform a series of operations including resist treatment over an object to be processed under a condition of a predetermined cleanness level, while eliminating the influences of ambient temperature and humidity. SOLUTION: A processing apparatus includes a processor 100 for performing a series of coating operations over a semiconductor wafer W, and a temperature/humidity controller provided above the processor for controlling the temperature and humidity of a vertical laminar flow in an introduced clean air and supplying the controlled clean air to the processor 100. The processor 100 has a transportation passage 102, a plurality of processing units 102 to 108 provided along the transportation path 102 for performing predetermined operations over the wafer W, and a transportation mechanism 110 for moving the transportation passage 102 to feed the wafer W into and out of the respective processing units.
申请公布号 JPH11135427(A) 申请公布日期 1999.05.21
申请号 JP19980237955 申请日期 1998.08.11
申请人 TOKYO ELECTRON LTD 发明人 MORIYAMA MASASHI
分类号 G03F7/16;B05C9/08;B05C11/08;G03F7/30;H01L21/027;H01L21/30;H01L21/677;H01L21/68;(IPC1-7):H01L21/027 主分类号 G03F7/16
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