发明名称 Semiconductor device produced by dry etching a narrow connection via
摘要 A semiconductor device is produced by forming an interlayer insulation layer (6) to cover a floating connection layer (3) on a substrate (100), forming a connection via (4) through the layers (6, 3) by dry etching using a fluorocarbon and forming a conductive plug (5) in the via for electrical connection to the connection layer (3). Independent claims are also included for production of similar devices which have: (i) a rib capacitor; or (ii) several floating polysilicon layers.
申请公布号 DE19820488(A1) 申请公布日期 1999.05.20
申请号 DE19981020488 申请日期 1998.05.07
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 KUSUMI, YOSHIHIRO, TOKIO/TOKYO, JP;YOKOI, TAKAHIRO, TOKIO/TOKYO, JP;IIDA, SATOSHI, TOKIO/TOKYO, JP
分类号 H01L21/302;H01L21/3065;H01L21/768;H01L21/8242;H01L21/8244;H01L23/522;H01L27/108;H01L27/11;(IPC1-7):H01L21/768;H01L21/28;H01L21/306 主分类号 H01L21/302
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