发明名称 Method and apparatus for testing phase shifter modules of a phased array antenna
摘要 <p>Faulty subarray module circuit boards are detected in a phased array antenna (68) having many subarray module circuit boards while the antenna (68) is fully assembled and operationally integrated with a radar (70) system. A far field radio frequency test source (73) illuminates the antenna (68). Binary digital signals that control subarray steering bits are set to a reference setting. A particular subarray module circuit board that is under test has its 180 DEG main phase bit toggled between 0 DEG and 180 DEG . The radar (70) selects the output of that particular subarray module by Doppler filter type of software filtering. The amplitude of the in-phase and quadrature phase (71, 72) signals from the radar (70) is recorded. The binary digital signals that control subarray steering bits are set to a second setting. The 180 DEG main phase bit of the module under test is again toggled between 0 DEG and 180 DEG . The output of the module under test is again selected by Doppler filter type of software filtering. The amplitude of the in-phase and quadrature phase signals from the radar (70) is recorded. The phase difference from the reference setting to the second setting is computed and compared with a predetermined threshold. If desired, the test source (69) may have a multi-element feed including multiple dipoles, each dipole having a radiation pattern wide enough to cover two rows of subarray modules, the test source (69) being switched to the particular one of the dipoles that illuminates the row including the module under test. <IMAGE></p>
申请公布号 EP0496381(B1) 申请公布日期 1999.05.12
申请号 EP19920101020 申请日期 1992.01.22
申请人 RAYTHEON COMPANY 发明人 LUI, SIEN-CHANG CHARLES
分类号 G01R29/10;H01Q3/26;(IPC1-7):G01R29/10 主分类号 G01R29/10
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