发明名称 |
Wiring network and semiconductor package |
摘要 |
This is a wiring network for forming a semiconductor element, the wiring network being formed by film-forming using a sputtering target comprising a high purified metal material selected from the group consisting of Ti, Zr and Hf, wherein the high purified metal material has an Al content of not more than 10ppm and each of Na and K contents of not more than 0.1ppm. <IMAGE> |
申请公布号 |
EP0915176(A1) |
申请公布日期 |
1999.05.12 |
申请号 |
EP19980204064 |
申请日期 |
1991.02.15 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
ISHIGAMI, TAKASHI;OBATA, MINORU;KAWAI, MITUO;SATOU, MICHIO;YAMANOBE, TAKASHI;MAKI, TOSHIHIRO;YAGI, NORIAKI;ANDO, SHIGERU |
分类号 |
C22B9/22;C22B34/10;C22B34/12;C23C14/34;H01L21/285;H01L21/768;H01L23/532 |
主分类号 |
C22B9/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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