发明名称 MICROWAVE TESTING HIGH-POWER DUMMY LOAD FORMING METHOD AND MICROWAVE TESTING HIGH-POWER DUMMY LOAD APPARATUS
摘要 In a microwave testing high-power dummy load forming method, a first center conductor, to which microwave power is input, is connected to a power distributor formed from a second center conductor having an output-side distal end branching into a plurality of portions so as to separate the microwave power input to the first center conductor into a plurality of outputs in correspondence with the output-side distal end of the second center conductor. A plurality of termination resistors are connected between the output-side distal end of the second center conductor and a ground conductor to make the termination resistors consume the microwave power. The heat generated by the termination resistors upon consumption of the microwave power is radiated. A microwave testing high-power dummy load apparatus is also disclosed.
申请公布号 CA2253325(A1) 申请公布日期 1999.05.11
申请号 CA19982253325 申请日期 1998.11.10
申请人 NEC CORPORATION 发明人 MAKIYAMA, JOJI
分类号 H01P1/26;H01P1/30;H01P3/02;H01P3/08;(IPC1-7):H01P1/26;H01P1/24 主分类号 H01P1/26
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