发明名称 |
Method for producing test program for semiconductor device |
摘要 |
The invention relates to a method for reducing the time required to test the functions of a semiconductor device. Test modules, each having a plurality of test statements, are created for testing predetermined functions of the device. Common test statements are extracted from the test modules. A test program is then produced by sequentially arranging the extracted statement(s) and the remaining statements from the test modules.
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申请公布号 |
US5901154(A) |
申请公布日期 |
1999.05.04 |
申请号 |
US19970873688 |
申请日期 |
1997.06.12 |
申请人 |
MATASUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
MOTOHAMA, MASAYUKI;HIRASE, JUNICHI;WATANABE, AKIHIKO;MAEKAWA, MICHIO |
分类号 |
G01R31/26;G01R31/28;G01R31/3183;G01R31/319;G11C29/00;G11C29/56;H01L21/66;(IPC1-7):G06F11/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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