发明名称 Trench MOSFET with multi-resistivity drain to provide low on-resistance
摘要 A MOSFET switch with a gate formed in a trench has a drain which includes a region of relatively high resistivity adjacent the trench and a region of relatively low resistivity further away from the trench. The drain may also include a "delta" layer having even lower resistivity in a central region of the MOSFET cell. The high resistivity region limits the strength of the electric field at the edge of the trench (particularly where there are any sharp corners) and thereby avoids damage to the gate oxide layer. The central "delta" layer helps to insure that any breakdown will occur near the center of the MOSFET cell, away from the gate oxide, and to lower the resistance of the MOSFET when it is in an on condition.
申请公布号 US5895952(A) 申请公布日期 1999.04.20
申请号 US19960701035 申请日期 1996.08.21
申请人 SILICONIX INCORPORATED 发明人 DARWISH, MOHAMED N.;WILLIAMS, RICHARD K.
分类号 H01L29/08;H01L29/78;(IPC1-7):H01L29/76;H01L29/94;H01L31/062 主分类号 H01L29/08
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