发明名称 X-RAY EXAMINATION APPARATUS INCLUDING AN X-RAY FILTER
摘要 An X-ray examination apparatus includes an X-ray source (1) for emitting X-rays. An object to be radiologically examined is arranged in an examination space. An X-ray detector (2) derives an image signal, for example an electronic video signal, from an X-ray image of the object. An X-ray filter locally attenuates the X-rays partly. The X-ray filter is arranged between the X-ray source and the X-ray detector and the X-ray filter is provided with filter elements whose X-ray absorptivity can be adjusted on the basis of an amount of X-ray absorbing liquid present within the individual filter elements. The X-ray examination apparatus includes an X-ray collimator for locally intercepting the X-rays. The X-ray collimator is arranged between the X-ray source and the examination space and is provided with collimator elements which can be switched between an X-ray transmitting state and an X-ray intercepting state. Individual collimator elements are filled with an X-ray intercepting liquid in the X-ray intercepting state. The amount of X-ray absorbing liquid present in the filter elements is controlled by application of an electric voltage to the relevant filter elements. The collimator elements are switched between the X-ray intercepting state and the X-ray transmitting state by means of an electric voltage which is applied to the relevant collimator elements.
申请公布号 WO9918579(A2) 申请公布日期 1999.04.15
申请号 WO1998IB01416 申请日期 1998.09.14
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS AB 发明人 LINDERS, PETRUS, WILHELMUS, JOHANNES;STEGEHUIS, HERMAN;WELTERS, WILHELMUS, JACOBUS, JOHANNES;WILLARD, NICOLAAS, PETRUS;FOKKINK, LAMBERTUS, GERRIT, JAN
分类号 G21K5/02;G21K1/00;G21K1/02;G21K1/10 主分类号 G21K5/02
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