发明名称 Semiconductor chip production process employs a protective layer
摘要 In a semiconductor chip production process, a protective layer (106) is applied and selectively etched away from regions in which a conductive layer (112) is to be formed, prior to applying and etching an insulating layer. In semiconductor chip production by applying an insulating layer onto a patterned structure on a substrate, etching the insulating layer to form insulation regions and forming a conductive layer (112) in the insulation-free regions, the novelty is that, prior to applying the insulating layer, a protective layer (106) is applied and then etched away from the regions in which the conductive layer (112) is to be formed. An Independent claim is also included for a semiconductor chip with a polysilicon region having, on each side, a silicon nitride layer and an overlying side spacer, a silicide layer being provided on the polysilicon region. Preferred Features: The insulating layer is an oxide layer. The conductive layer (112) is produced by siliciding.
申请公布号 DE19839186(A1) 申请公布日期 1999.04.15
申请号 DE19981039186 申请日期 1998.08.28
申请人 NATIONAL SEMICONDUCTER CORP., SANTA CLARA, CALIF., US 发明人 BLAIR, CHRISTOPHER SCOTT, SAN JOSE, CALIF., US
分类号 H01L21/28;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/28
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