发明名称 |
Semiconductor chip production process employs a protective layer |
摘要 |
In a semiconductor chip production process, a protective layer (106) is applied and selectively etched away from regions in which a conductive layer (112) is to be formed, prior to applying and etching an insulating layer. In semiconductor chip production by applying an insulating layer onto a patterned structure on a substrate, etching the insulating layer to form insulation regions and forming a conductive layer (112) in the insulation-free regions, the novelty is that, prior to applying the insulating layer, a protective layer (106) is applied and then etched away from the regions in which the conductive layer (112) is to be formed. An Independent claim is also included for a semiconductor chip with a polysilicon region having, on each side, a silicon nitride layer and an overlying side spacer, a silicide layer being provided on the polysilicon region. Preferred Features: The insulating layer is an oxide layer. The conductive layer (112) is produced by siliciding.
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申请公布号 |
DE19839186(A1) |
申请公布日期 |
1999.04.15 |
申请号 |
DE19981039186 |
申请日期 |
1998.08.28 |
申请人 |
NATIONAL SEMICONDUCTER CORP., SANTA CLARA, CALIF., US |
发明人 |
BLAIR, CHRISTOPHER SCOTT, SAN JOSE, CALIF., US |
分类号 |
H01L21/28;H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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