SEMICONDUCTOR MEMORY DEVICE WITH DATA COMPRESSION TEST FUNCTION AND ITS TESTING METHOD,申请号KR19950045355-传众专利搜索

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发明名称	SEMICONDUCTOR MEMORY DEVICE WITH DATA COMPRESSION TEST FUNCTION AND ITS TESTING METHOD
摘要
申请公布号	KR0181579(B1)	申请公布日期	1999.04.15
申请号	KR19950045355	申请日期	1995.11.30
申请人	FUJITSU LTD.	发明人	UCHIDA, TOSHIYA
分类号	G06F12/16;G11C11/401;G11C29/26;G11C29/34;G11C29/40;(IPC1-7):G11C29/00	主分类号	G06F12/16
代理机构		代理人
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