发明名称 |
METHOD OF ANODIZING SILICON SUBSTRATE AND METHOD OF PRODUCING ACCELERATION SENSOR |
摘要 |
A method of anodizing a silicon substrate includes a step of forming an n-type silicon buried layer (21) of n-type silicon in a predetermined region in a first surface of a p-type monocrystalline silicon substrate (2). The n-type silicon buried layer (21) has at its central portion an opening (21a) for a current to flow. N-type silicon layers (4, 6) are formed on the surface of the p-type monocrystalline silicon substrate (2) and on the n-type silicon buried layer (21). Silicon diffusion layers (5, 7) containing p-type impurities at a high concentration are formed in predetermined regions of the n-type silicon layers (4, 6) and are in contact with the n-type silicon buried layer (21). An electrode layer (13) is formed on the back surface of the p-type silicon substrate (2). The anode of a DC power source (15) is connected to the electrode layer (13), and the cathode is connected to an electrode (23) opposed to the p-type silicon substrate (2). A current is made to flow concentratedly into a region corresponding to the opening (21a) of the n-type silicon layer (4) in the direction from the back surface toward the front surface of the p-type monocrystalline silicon substrate (2) immersed in a hydrofluoric acid solution, so that the region is turned porous.
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申请公布号 |
WO9917375(A1) |
申请公布日期 |
1999.04.08 |
申请号 |
WO1998JP04312 |
申请日期 |
1998.09.25 |
申请人 |
KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO;IWATA, HITOSHI;MURATE, MAKOTO |
发明人 |
IWATA, HITOSHI;MURATE, MAKOTO |
分类号 |
B81B3/00;G01P15/08;H01L21/3063;H01L29/84;(IPC1-7):H01L29/84;H01L21/306 |
主分类号 |
B81B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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