METHOD FOR MEASURING RESIDUAL CAPACITY OF SECONDARY CELL HAVING NICKEL HYDROXIDE POSITIVE PLATE

摘要

A method for measuring the residual capacity of a secondary cell, wherein the judging voltage value which is used for judging whether or not the residual capacity of a secondary cell having a nickel hydroxide positive plate in the final stage of discharge reaches an allowable lower limit based on a value (V0) lower than the voltage value (V1) when the residual capacity reaches the allowable limit at the time of first discharge. The value (V0) is determined considering the voltage value (V1) and the voltage value which successively drops due to the memory effect when the residual capacity reaches the allowable lower limit at the second and later discharges.