发明名称 MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To remove a hard mask used for opening a connection hole without damages to a member present at a bottom part of the connection hole. SOLUTION: An insulating film 24, which is formed with the same layer as an information storage capacity element C, is formed in a peripheral circuit region of a semiconductor substrate 1. After the information storage capacity element C has been formed, an insulating film 30a and an SOG film 30b are formed to plararize a surface. Then, a hard mask 41 is formed, and connection holes 42 and 43 are opened using it. Further, after a resist film 44 has been formed on the entire surface of a semiconductor substrate 1, the resist film 4 is ashed for the resist film 44 so as to remain only in connection holes 42 and 43. Then, while a sidewall and a bottom part of the connection holes 42 and 43 are protected by the resist film 44, the hard mask 41 is etched and removed.
申请公布号 JPH1187650(A) 申请公布日期 1999.03.30
申请号 JP19970242328 申请日期 1997.09.08
申请人 HITACHI LTD 发明人 KAWAKAMI HIROSHI;HASEGAWA NORIO;HAYANO KATSUYA;KAWAKITA KEIZO
分类号 H01L21/302;H01L21/3065;H01L21/768;H01L21/8242;H01L27/108 主分类号 H01L21/302
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