发明名称 METHOD AND CONTROL SYSTEM FOR PREVENTION OF SCRATCH FLAW ON BACKSIDE OF WAFER BY TAKEOUT ARM OF STEPPER MACHINE
摘要 <p>PROBLEM TO BE SOLVED: To obtain a method and a control system in which a frictional force between the backside of a wafer and a suction head is reduced when the wafer collides with the side part of a cassette holder by a method wherein, before the wafer is inserted into the cassette holder, a negative pressure inside the suction head is released. SOLUTION: A negative-pressure release controller 500 is provided with a timing control circuit 530 which is connected to a first signal delay circuit 510 and to a second signal delay circuit 520 and which generates a first delay signal and a second delay signal. By the timing control circuit 530 and by a light shutoff-type electronic switching circuit 540, a second control signal and a first control signal which is generated by a microcontroller are received, a negative-pressure solenoid, valve is controlled, and the negative-pressure release and negative-pressure holding sequence of a suction head at a takeout arm is controlled. Then, the second control signal releases a negative pressure until a second prescribed time when the takeout arm reaches a second position since the finish of a first prescribed time when the takeout arm starts to be separated from a first position.</p>
申请公布号 JPH1187471(A) 申请公布日期 1999.03.30
申请号 JP19970339883 申请日期 1997.12.10
申请人 RENSEI SEKITAI DENRO KOFUN YUGENKOSHI 发明人 CHIN TENGA;SO CHINKYU
分类号 B65G1/00;B65G49/07;H01L21/00;H01L21/027;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65G1/00
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