发明名称 TEST CONTACTOR
摘要 <p>A test contactor (10) for establishing a releasable connection between terminals in electronic modules (52) and a circuit board includes a housing (4) carrying a contact element (12) for each terminal of the module. Each contact element includes a contact surface (28) which is engaged by the corresponding terminal of the modules when testing is effected. The contact surface is connected to a pad (22) which connects the contact element to the circuit board by a spring arm (24) that is slidably engaged with the pad. Accordingly, as the contact element is deflected during testing, the spring arm slides along the pad, and the resiliency of the contact element restores itself to its initial condition when the module is removed. The spring arm provides the shortest possible electrical path between the contact surface and the pad, thereby assuring a high frequency response.</p>
申请公布号 WO1999014603(A1) 申请公布日期 1999.03.25
申请号 US1998019104 申请日期 1998.09.15
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