| 发明名称 |
PROBE MICROSCOPY |
| 摘要 |
<p>A general purpose force sensor for measuring nanometer scale surface topography and other characteristics includes a hollow micropipette (1.1) having an inner diameter of about 7.5 nanometers at its tip. The probe includes a cantilevered structure obtained by heating it near the tip to bend it. A reflective coating (1.4) is then applied to the outer surface of the micropipette.</p> |
| 申请公布号 |
EP0712533(B1) |
申请公布日期 |
1999.03.24 |
| 申请号 |
EP19940924544 |
申请日期 |
1994.08.05 |
| 申请人 |
LEWIS, AARON |
发明人 |
LEWIS, AARON;LIEBERMAN, KLONY |
| 分类号 |
G01B11/00;G01B7/34;G01N37/00;G01Q20/02;G01Q60/22;G02B21/00;G11B9/00;H01J37/28;(IPC1-7):H01J37/00 |
主分类号 |
G01B11/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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