发明名称 ELECTROMAGNETIC INTERFERENCE WAVE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To enable measurement of an electromagnetic interference wave from which extraneous noise is eliminated without using a radio wave anechoic chamber. SOLUTION: When an electromagnetic noise with directivity strong on the right side of the X axis is generated from an object 1 to be measured, this noise is measured by an extraneous noise detection antenna 1, in a specified time after measured by an EMI(electromagnetic interference) antenna 3, that is, 3.3 ns obtained by dividing a distance of 1m, between the EMI antenna 3 and the extraneous noise detection antennas 81 -86 by the velocity of 3×10<8> m of the electromagnetic wave. contrarily, when an extraneous noise comes from the right side of the X axis, the extraneous noise is detected by the extraneous noise detection antenna 81 and subsequently, sensed by the EMI antenna 3 in 3.3 ns. thereafter. This can distinctively determine whether the wave is the electromagnetic noise or the extraneous noise from the object 1 at a timing when the noise is detected by the respective antennas. After the processing involved, the EMI antenna 3 is moved by an EMI antenna position moving device to accomplish a series of measurements.
申请公布号 JPH1172519(A) 申请公布日期 1999.03.16
申请号 JP19970249850 申请日期 1997.08.29
申请人 RICOH CO LTD 发明人 KANAI TAKESHI
分类号 G01R29/08;(IPC1-7):G01R29/08 主分类号 G01R29/08
代理机构 代理人
主权项
地址