发明名称 Method for using oxygen plasma treatment on a dielectric layer
摘要 The method for depositing a dielectric layer can be used to evenly deposit the dielectric layer to be applied to a semiconductor device. The method includes steps of: a) providing a substrate; b) depositing a first dielectric film on the subtrate; c) introducing an oxygen plasma for eliminating an uneven distribution of charges on a surface of the substrate; and d) forming a second dielectric film on the first dielectric film treated with the oxygen plasma for obtaining the dielectric layer having a uniform thickness on the substrate,
申请公布号 US5883015(A) 申请公布日期 1999.03.16
申请号 US19970887886 申请日期 1997.07.03
申请人 MOSEL VITELIC INC. 发明人 LIAO, KENT;HUANG, DINOS;TU, TUBY;CHEN, KUANG-CHAO;SU, WEN-DOE
分类号 C23C16/40;H01L21/314;H01L21/316;(IPC1-7):H01L21/316 主分类号 C23C16/40
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