发明名称 STAGE FOR QUARTZ CRYSTAL SUBSTRATE AND FLAW INSPECTING DEVICE FOR QUARTZ CRYSTAL SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To easily place a quartz crystal blank at a specified position on a stage, when a quartz crystal blank is placed, and to easily release it from the stage at picking up. SOLUTION: Relating to a flaw detection of a quartz crystal blank 1, a diffused oblique ray is emitted from a light-emitting diode 6 from below the quartz crystal blank 1, and the light reflected on the flaw of the quartz crystal blank 1 is detected with an imaging means 11 just above the quartz crystal blank 1. The quartz crystal blank 1 is carried in by a transportation robot arm 15 on a stage 2, and carried out after inspection. Multiple grooves are formed on a placement surface 3 of the stage 2. By this, the quartz crystal blank 1 does not slip on the stage 2 when placing, while it does not adhere to the stage 2 after placement.
申请公布号 JPH1164232(A) 申请公布日期 1999.03.05
申请号 JP19970227920 申请日期 1997.08.25
申请人 NIPPON MAKUSHISU:KK 发明人 KOBAYASHI SATORU
分类号 G01N21/88;G01N21/958;G06T1/00;G06T7/00 主分类号 G01N21/88
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