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发明名称
METHOD AND DEVICE FOR CONTINUITY INSPECTION IN ELECTRONIC PART
摘要
申请公布号
JPH1164425(A)
申请公布日期
1999.03.05
申请号
JP19970227682
申请日期
1997.08.25
申请人
NEC CORP
发明人
SAKAI HIROSHI
分类号
G01R1/06;G01R1/067;G01R31/02;G01R31/28;H05K1/02;H05K1/11;(IPC1-7):G01R31/02
主分类号
G01R1/06
代理机构
代理人
主权项
地址
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