发明名称 METHOD AND APPARATUS FOR INSPECTING STRIPE LIKE DEFECT
摘要 PROBLEM TO BE SOLVED: To detect even a stripelike defect of low sensitivity with high accuracy when an inspection image inputted as a color image is processed as monochromatic images of R, G and B. SOLUTION: A stripelike defect inspection apparatus detecting a stripe defect generated on printed matter from an inspection image wherein the printed matter is inputted as a color image is equipped with an image input part 10 inputting the inspection image to separate the same into respective monochromatic images of R, G and B, a pattern removing part 12 for removing a pattern part from the inspection image with respect to each of the monochromatic images, a stripe emphasizing part 14 applying emphasizing processing to the stripe part present in the image after the pattern is removed, an RGB synthesizing part 20 synthesizing the respective monochromatic images after emphasizing processing to form a synthetic image and a judge part 16 for judging the presence of a stripe-like defect based on the synthetic image.
申请公布号 JPH1148457(A) 申请公布日期 1999.02.23
申请号 JP19970213212 申请日期 1997.08.07
申请人 DAINIPPON PRINTING CO LTD 发明人 SATO HIROSHI;SAKATA HIDETO;SOEDA MASAHIKO;HAYASHI KENTA
分类号 B41F33/14;G01N21/88;G01N21/89;G01N21/892;G01N21/93;G06T1/00;G06T7/00 主分类号 B41F33/14
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