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经营范围
发明名称
SEMICONDUCTOR TESTING JIG
摘要
申请公布号
JPH1138081(A)
申请公布日期
1999.02.12
申请号
JP19970198774
申请日期
1997.07.24
申请人
NEC ENG LTD
发明人
AKASHI YASUHIRO
分类号
G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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