发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device of new structure which is high in both the operating performance and reliability. SOLUTION: In a semiconductor device which takes advantage of a crystal semiconductor thin film, formed on a substrate 106 possessed of an insulating surface, impurities are locally injected into an active region 102 for the formation of a pinning region 104. The pinning region 104 restrains a depletion layer from expanding from a drain side, so as to prevent a short channel effect effectively. Since a channel forming region 105 is intrinsic or substantially intrinsic, high mobility is realized.
申请公布号 JPH1140815(A) 申请公布日期 1999.02.12
申请号 JP19970205347 申请日期 1997.07.14
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;OTANI HISASHI;MIYANAGA SHOJI;MITSUKI TOORU;FUKUNAGA KENJI
分类号 B82B1/00;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L29/786 主分类号 B82B1/00
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