发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device of new structure which is high in both the operating performance and reliability. SOLUTION: In a semiconductor device which takes advantage of a crystal semiconductor thin film, formed on a substrate 106 possessed of an insulating surface, impurities are locally injected into an active region 102 for the formation of a pinning region 104. The pinning region 104 restrains a depletion layer from expanding from a drain side, so as to prevent a short channel effect effectively. Since a channel forming region 105 is intrinsic or substantially intrinsic, high mobility is realized. |
申请公布号 |
JPH1140815(A) |
申请公布日期 |
1999.02.12 |
申请号 |
JP19970205347 |
申请日期 |
1997.07.14 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;OTANI HISASHI;MIYANAGA SHOJI;MITSUKI TOORU;FUKUNAGA KENJI |
分类号 |
B82B1/00;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
B82B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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