| 摘要 |
An atomic force microscope and method of operation are provided and include a force sensing probe tip (48) adapted to be brought into close proximity with a sample surface (52), a scanning element (50) for generating relative movement between the probe tip and the sample surface, a device (62) for generating a magnetic field to cause deflection of the probe tip, a driver (73) for the device, the driver including a source of alternating current (66) and a source of a second current (74) of a controlled magnitude, and a detector (60) for detecting the position of the probe tip. In a preferred mode of operation, two signals, one of alternating current and the other of a fixed, but variable, current, are applied to cause a displacement of the time-average position of the probe tip. |
