| 摘要 |
The present invention provides a lens holder (14) for a lens under test (26) in an in-line hologram interferometric test apparatus (10) which includes a flat reflective surface (34) for rotationally positioning the lens under test and a spherical reflective surface (32) for translationally positioning the lens under test (26). According to this configuration, the lens holder (14) is translationally positioned using the spherical reflective surface (32) to reflect radiation back to the interferometer (12) at a precise distance and position using normal interferometric techniques. The lens under test (26) is rotationally positioned by pivoting the lens holder (14), both in tip and in tilt, so that the flat reflective surface (34) is nulled to the interferometer (12). Thereafter, the lens holder (14) is correctly positioned relative to the hologram (22) and interferometer (12) so that when the lens under test (26) is seated on the lens holder (14), its aspherical shape can be tested.
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