发明名称 METHOD FOR FORMING CAPACITOR AND METHOD FOR FORMING DRAM CELL
摘要 PROBLEM TO BE SOLVED: To form a capacitor in a semiconductor body without additional adverse effects on the structure, without removing a part of a pad silicon oxide layer, during the etching for removing a bottom part of glass. SOLUTION: While a semiconductor body 10 is heated which has a doped film deposited on the semiconductor body 10 and the dopant in the doped film is diffused into a region 30 of the semiconductor body 10, a liquid phase interface region is produced between the semiconductor body 10 and the doped film, this interface region is restored to solid phase by cooling the interface region, a dielectric film 26 is formed on the doped region 30, and doped material is deposited on the dielectric film 26.
申请公布号 JPH1117133(A) 申请公布日期 1999.01.22
申请号 JP19980151158 申请日期 1998.06.01
申请人 SIEMENS AG 发明人 SHEN HUA
分类号 H01L27/108;H01L21/334;H01L21/8242;H01L29/94 主分类号 H01L27/108
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