METHOD AND APPARATUS FOR VISUAL DEFECT INSPECTION,申请号JP19970165852-传众专利搜索

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发明名称	METHOD AND APPARATUS FOR VISUAL DEFECT INSPECTION
摘要
申请公布号	JPH1114554(A)	申请公布日期	1999.01.22
申请号	JP19970165852	申请日期	1997.06.23
申请人	OMRON CORP	发明人	NAGAO KASUKE;TANAKA MASAKI
分类号	G01N21/88;G01N21/93;(IPC1-7):G01N21/88	主分类号	G01N21/88
代理机构		代理人
主权项
地址

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