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发明名称
Method and apparatus for inspecting high-precision patterns
摘要
申请公布号
EP0838679(A3)
申请公布日期
1999.01.20
申请号
EP19970250312
申请日期
1997.10.22
申请人
NEC CORPORATION
发明人
MURAKAMI, SHINGO;YAMANE, TSUYOSHI;OGURA, YUKIO;NAKATANI, KATSUHIKO;AIDA, YOSHIAKI
分类号
G01N21/95;H01L21/66;(IPC1-7):G01N21/88
主分类号
G01N21/95
代理机构
代理人
主权项
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