发明名称 Microcontroller with improved debug capability for internal memory
摘要 A microcontroller integrates an internal memory accessible by the cores included thereon. Logic within the microcontroller compares memory addresses generated by the cores to values in a configuration register specifying a memory address range in which the internal memory resides. The logic generates a chip select signal to the internal memory if the memory address generated resides within the specified address range to enable accesses by the cores to the internal memory. The integrated circuit may be configured in a debug mode wherein the chip select signal is inhibited to the internal memory, however the chip select signal is provided external to the integrated circuit on a pin. The chip select signal may then be used to select an external memory which serves to overlay the internal memory address range. Thus the debug mode allows instruction code and data to reside in the external memory rather than the internal memory while in the debug mode. This facilitates debugging of the code since the contents of the external memory may be examined, for example by an in-circuit emulator, in a less intrusive manner than the contents of the internal memory may be examined. The debug mode may be enabled by asserting a signal upon a predefined pin at the conclusion of reset of the microcontroller. By providing the predefined pin for placing the microcontroller into the debug mode, the microcontroller may be placed into the debug mode for debug purposes without changing the instruction code being executed thereon. Furthermore, the in-circuit emulator need not have knowledge of the internal memory address range.
申请公布号 US5862148(A) 申请公布日期 1999.01.19
申请号 US19970798249 申请日期 1997.02.11
申请人 ADVANCED MICRO DEVICES, INC. 发明人 TYPALDOS, MELANIE D.;CHAMBERS, ERIC G.;WILLIAMS, WADE L.
分类号 G06F11/36;(IPC1-7):G06F11/00 主分类号 G06F11/36
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