The present invention discloses a circuit for controlling operation of a functional circuit in a device based on a test result during testing. The circuit comprises a first storage element configured to be in one of a first state and a second state according to the test result, and a first sensing element coupled to the first storage element for generating a first signal used to control the operation of the functional circuit.
申请公布号
US5859803(A)
申请公布日期
1999.01.12
申请号
US19970925020
申请日期
1997.09.08
申请人
INFORMATION STORAGE DEVICES, INC.
发明人
NAZARIAN, HAGOP;SOWARDS, DAVID;ENGH, LAWRENCE D.;HOEI, JUNG SHENG;LEE, MAY