| 摘要 |
PROBLEM TO BE SOLVED: To obtain a monitoring burn-in method in which an instruction stored in a built-in read-only memory(ROM) is executed during a burn-in test(BT), in which the whole content of the built-in ROM is swept out to one terminal, in which more integrated circuits (IC's) are tested by one test, and in which the content of the built-in ROM is monitored and checked during the BT. SOLUTION: A program counter(PC) 107 is fixed to a simple increment operation by a test-mode signal 103. The read operation of instructions is executed sequentially from the front address of a ROM 110. At the same time, they are fetched to a bit selection circuit 114, and bits are selected properly so as to be swept out to a terminal 119. When the address of the ROM 110 to be read out and the bits selected by the bit selection circuit 114 are combined, the whole content of the ROM 110 can be swept out to the terminal 119. During a BT, the content which is swept out is collated with an expected value which is prepared in advance, and whether the content of the ROM 110 is corrected or not is checked. |
