发明名称 |
ANGLE DISPERSIVE X-RAY SPECTROMETER |
摘要 |
An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator comprising a shape which is substantially identical to a logarithmic spiral, and a position-sensitive x-ray detector. A method of measuring diffraction intensities from oriented samples in real time including providing an x-ray spectrometer comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved monochromator comprising the shape of a logarithmic spiral, and a position-sensitive x-ray detector; and providing a crystallographically oriented sample, exposing the sample to the focused x-ray beam of the x-ray spectrometer; and measuring the diffraction intensity at the position-sensitive detector. |
申请公布号 |
WO9858245(A1) |
申请公布日期 |
1998.12.23 |
申请号 |
WO1998US12540 |
申请日期 |
1998.06.17 |
申请人 |
MOLECULAR METROLOGY, INC. |
发明人 |
BARTON, SCOTT, W.;CALANDRA, PETER, M. |
分类号 |
G01B15/02;G01N23/20;G01N23/207;G21K1/06 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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