THE MULTI-TEST ADJUSTING SYSTEM FOR MULTI-TEST,申请号KR19950007134-传众专利搜索

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发明名称	THE MULTI-TEST ADJUSTING SYSTEM FOR MULTI-TEST
摘要
申请公布号	KR0148944(B1)	申请公布日期	1998.12.15
申请号	KR19950007134	申请日期	1995.03.30
申请人	DAEWOO ELECTRONICS CO.,LTD	发明人	JANG, HEE-SUK;JOO, ILL-KWAN
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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