发明名称 Speicher mit Spaltenredundanz und mit örtlich begrenzten Spaltenredundanzsteuersignalen
摘要 A memory (20) has a plurality of columns of memory cells and has a plurality of redundant columns of memory cells. A comparator (45) detects an access to a defective column. A redundant write generator (31) and write fuses (32) are provided for each write portion (30A, 30B, 30C, and 30D) to replace the defective column with a redundant column by replacing a write global data line (37) with a redundant write global data line (39). Redundant read generators (60 and 61) and read fuses (59) are provided for each read portion (50A, 50B, 50C, and 50D) to replace a defective column by deselecting a read global data line (29) and replacing it with a redundant read global data line (44). The fuses and redundant generators are located close to their global data lines, thus reducing the routing of control signals and improving the access time of redundant columns. <IMAGE>
申请公布号 DE69318330(T2) 申请公布日期 1998.12.03
申请号 DE1993618330T 申请日期 1993.02.23
申请人 MOTOROLA, INC., SCHAUMBURG, ILL., US 发明人 FENG, TAISHENG, AUSTIN, TEXAS 78729, US;FLANNAGAN, STEPHEN, AUSTIN, TEXAS 78729, US;PORTER, JOHN DAVID, AUSTIN, TEXAS 78759, US
分类号 G11C29/00;G11C29/04;(IPC1-7):G06F11/20 主分类号 G11C29/00
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