发明名称 |
Method of and systems for measuring eccentricity of an aspherical lens surface |
摘要 |
Accurate yet cost-effective measurement methods and systems determine eccentricity at a particular location of the aspherical lens surface. Since an aspherical lens generally has varying degrees of curvature along the aspherical surface, the eccentricity at the selected location on the aspherical lens surface provides precise information in determining the quality of a certain type of an aspherical lens component. Furthermore, these improved methods and systems according to the current invention are applicable to measure eccentricity of a selected aspherical lens surface in a complex lens assembly containing a plurality of aspherical lens components.
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申请公布号 |
US5844670(A) |
申请公布日期 |
1998.12.01 |
申请号 |
US19960681822 |
申请日期 |
1996.07.29 |
申请人 |
RICOH CO., LTD. |
发明人 |
MORITA, NOBUHIRO;TAKAI, MASAYUKI |
分类号 |
G01B11/255;G01M11/02;(IPC1-7):G01B9/00 |
主分类号 |
G01B11/255 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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