发明名称 Transistor-containing semiconductor device e.g. memory device
摘要 A semiconductor device (100) has a semiconductor substrate (1) bearing one or more transistors (T41-43) , each of which has a first conductivity type semiconductor layer formed on the substrate surface, a first conductivity type channel doping layer (103A-C) selectively formed in the semiconductor layer and a control electrode (4A-C) formed over the semiconductor layer at a position facing the channel doping layer. The control electrode has a polysilicon layer which contains a second conductivity type dopant and nitrogen, the nitrogen being introduced into the lower region of the polysilicon layer such that the dopant has a relatively high concentration in the upper region and a relatively low concentration in the lower region of the polysilicon layer. Also claimed is a similar device in which the transistor has an active region formed by a field oxide layer which is selectively formed on the substrate surface, an oxide layer formed on the active region and a control electrode a s described above formed on the oxide layer. Further claimed is a process for producing the above semiconductor device.
申请公布号 DE19800089(A1) 申请公布日期 1998.11.19
申请号 DE19981000089 申请日期 1998.01.02
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 UENO, SHUICHI, TOKIO/TOKYO, JP;OKUMURA, YOSHINORI, TOKIO/TOKYO, JP;MAEDA, SHINGENOBU, TOKIO/TOKYO, JP;MAEGAWA, SHIGETO, TOKIO/TOKYO, JP
分类号 H01L29/78;H01L21/762;H01L21/8234;H01L21/8242;H01L21/8247;H01L27/088;H01L27/10;H01L27/108;H01L27/115;(IPC1-7):H01L29/78 主分类号 H01L29/78
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