发明名称 LOW RESISTIVITY W USING B2H6
摘要 A multiple step chemical vapor deposition process for depositing a tungsten layer on a substrate (16). A first step of the depostion process includes a nucleation step in which WF6 and SiH4 are introduced into a deposition chamber (step 200). Next, the flow of WF6 and SiH4 are stopped and diborane is introduced into the chamber (12) for between 5-25 seconds (step 210). Finally, during a bulk deposition step, the WF6 is reintroduced into the chamber along with H2 and B2H6 flows to deposit a tungsten layer on the substrate (step 220). In a preferred embodiment, the bulk deposition step also introduces nitrogen into the process gas.
申请公布号 WO9851838(A1) 申请公布日期 1998.11.19
申请号 WO1998US10078 申请日期 1998.05.15
申请人 APPLIED MATERIALS, INC.;RAJAGOPALAN, RAVI;GHANAYEM, STEVE;YAMAZAKI, MANABU;OHTSUKA, KEIICHI;MAEDA, YUJI 发明人 RAJAGOPALAN, RAVI;GHANAYEM, STEVE;YAMAZAKI, MANABU;OHTSUKA, KEIICHI;MAEDA, YUJI
分类号 C23C16/08;C23C16/02;C23C16/14;H01L21/28;H01L21/285;H01L21/768;(IPC1-7):C23C16/06;B32B15/01 主分类号 C23C16/08
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